夹杂氧化物
Analysis of ESR spectroscopy of nitric oxide free radical trapped by DETC iron complex in biological tissue
用DETC铁络合物捕捉生物组织NO自由基的ESR波谱解析
High electric field annealing effect in thin gate oxide of MOS structure is studied in depth, and the detrapping mechanisms of trapped charge in the gate oxide are investigated.
深入研究了MOS结构中薄栅氧化层在高电场下的退火效应,对氧化层陷阱电荷的退陷阱机理进行了深入探讨。
Trapped charge buildup during irradiation in buried oxide, which dominantly induces back channel leakage, is investigated.
对诱发背沟道泄漏电流的陷阱电荷进行了研究。
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